S. C. Chaudhari and R. N. Patil
Dielectric properties such as dielectric constant (Î’) and dielectric loss tangent were studied as a function of composition, frequency and temperature for a series of Cu1+XTixFe2-2xO4 ferrite samples prepared by using conventional ceramic technique. Initial Ti4+ ion substitution results in decrease in dielectric constant while dc resistivity increases on substitution. The measurement of dielectric constant with frequency (100Hz-1MHz) shows decrease in dielectric constant with increasing frequency and tends to reach constant value. Variation of dielectric constant with frequency at different temperature show increase in dielectric constant in general and the tendency of dispersion in dielectric constant observed increase with temperature. The variation of dielectric constant with temperature at different frequencies was studied. Dielectric constant steadily increases reaches to maximum and thereafter decreases. The frequency dependence of dielectric loss tangent is found to be abnormal for some samples. The frequency dependence of dielectric loss tangent at various temperatures was studied, the abnormal behavior of dielectric relaxation processes was observed. A.C. Conductivity was derived from dielectric constant and loss tangent data. The conduction in this system is interpreted as due to small polaron hopping.
