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Research Article - (2023) Volume 7, Issue 2

A Semi-empirical Approach to Bulk Modulus of ANB8-N Semiconductors and Their Alloys
Mritunjai Kumar Pathak1, Madhu Sudan Dutta1, Sanjay Kumar Gorai2, Ashok Kumar Gupta1, Rajendra Nath Sinha1 and Parmanand Mahto1*
 
1Department of Physics, Vinoba Bhave University, Hazaribag, Jharkhand, India
2Department of Physics, Tata College, West Singhbhum, Jharkhand, India
 
*Correspondence: Parmanand Mahto, Department of Physics, Vinoba Bhave University, Hazaribag, Jharkhand, India, Tel: pmahtovbu@rediffmail.com,

Received: 21-Feb-2023, Manuscript No. IPACRH-23-15742; Editor assigned: 23-Feb-2023, Pre QC No. IPACRH-23-15742 (PQ); Reviewed: 09-Mar-2023, QC No. IPACRH-23-15742; Revised: 21-Apr-2023, Manuscript No. IPACRH-23-15742 (R); Published: 28-Apr-2023, DOI: 10.21767/2572-4657.23.7.11

Abstract

In this study, a semi-empirical relation has been developed for bulk modulus in terms of bond energy and bond length and applied to elemental and binary semiconductors. The basis of this formula originates from the very definition of bulk modulus. The universal parameter tight binding approach has been utilized with some modification in the overlap parameter to evaluate bond energy and bond length. The results are in reasonable agreement with those of experiments. The new formula has also been applied to ternary as well as quaternary alloys of II-VI and III-V semiconductors including some highly mismatched alloys. The trend of variation of bulk modulus with composition for both cationic and anionic substitution is explained in terms of ionic size effect.

Keywords

Bond energy; Bond length; Bulk modulus; Solar cell; Highly mismatched alloys; Universal parameter tight binding theory

Introduction

Semiconductors have long been used widely in electronic industry and today there is hardly any field left without the application of semiconductors. This is because each type of semiconductors has some specific characteristics for an application. The range and horizon of application of semiconductors is broadened further by allowing them to tailor the material properties like lattice parameters, band gaps, bond length, iconicity hardness, bulk modulus etc. required for the new and desired applications [1-13]. For example, the dilute nitride alloys GaAs1-xNx and Ga1-xInxAs1-yNy; dilute oxide alloys ZnS1-xOx and Zn1-xCdxTe1-yOy and some other such combinations BxGa1-xN, ZnO1-xTex have been identified as Highly Mismatched Alloys (HMAs) which are the potential candidates for high efficiency solar cell. However, the stability of solar cells is of concern for their application in space, where they have to withstand bombardment of high energy particles like electrons, protons cosmic rays etc. that can cause severe damage to solar cells. Also in domestic, industrial and commercial applications the electronic appliances have to face mechanical stresses and electrical jerks due to voltage fluctuations.

Therefore, study on mechanical properties of these semiconductors and their alloys are of prime importance. Among these properties, focus has been made on bulk modulus, which has in many cases been correlated with material strength and hardness, and it is commonly accepted that material with larger bulk modulus are accepted to be harder ones. Of course, this is not always true and recently it has been found that even the materials with very high bulk moduli have low hardness. For example, Rhenium was predicted to have high bulk modulus (405 GPa), but its (Vickers’s) hardness was found to be 16.7 GPa, which is about five times lower than that of diamond [14]. Based on this common concept, C3N4 was initially proposed to be one of the hardest materials comparable with diamond as its bulk modulus was estimated to be 443 GP, but later on it was synthesized and its hardness was found to be even lower than diamond and BN [15]. Even then bulk modulus is considered as one of the important parameters to characterize physical properties, and for many applications it is used as indicator for materials strength and hardness. In the backdrop of the above scenario, a semi-empirical formula has been developed and presented in this study for bulk modulus of Group IV and IV-IV, II-VI and III-V semiconductors and their ternary and quaternary alloys.

Materials and Methods

Theoretical Methods

Brief review of earlier researches: On the theoretical front empirical tight binding method [16], effective bond orbital method [17,18], empirical self-consistent pseudopotential method [19] and density functional theory [20] have emerged as powerful tools for precise calculation of ground state properties of materials. Although various software is, available for these methods, they require profound understanding of the nature of chemical bonding in materials and also advanced computational facilities. Empirical methods easy to work and they also produced results quite in agreement with experimental values and also with those obtained from the advanced computational schemes. Therefore, a number of empirical methods have been developed by researchers for computing bulk modulus of semiconductors. Cohen developed the following bond length (d in Å) dependent relation for bulk modulus of semiconductors.

B=1761d-3.5                                     (1)

Where;

B=Bulk modulus.

Later on an empirical parameter, λ was introduced in this formula to incorporate the effect of iconicity which stands as follows,

B=(1971-220 λ )/d3.5                       (2)

Where;

λ=0,1 and 2 for group-IV and IV-IV, III-V and II-Vi respectively.

This formula was quite successful in estimating bulk modulus of III-V semiconductors, but a deviation of estimated values from experimental ones resulted in the range 10.1%-17.3% in case of II-VI systems. This relation was further extended to study non-octet semiconductors like Si3N4 for which following modified formula was suggested.

B=<NC>(1971-220 λ )/4d3.5            (3)

Where;

<NC>=Stands for an average coordination number. Lam, et al., however, deduced an analytical relation of bulk modulus to the lattice parameters within the local density approximation and the pseudopotential as:

B=(1971/d3.5)–408 (ΔZ)2/d4            (4)

Where;

ΔZ=0,1,2,3 for group-IV, III-V, II-VI and I-VII semiconductors respectively. But this formula was applicable to III-V semiconductors only. For II-VI systems they suggested some modification in it. Al-Douri, et al., also suggested a formula similar to that of Cohen.

B=(3000-100 λ) (a/2)-3.5                  (5)

Where;

a=Lattice parameter. This formula estimated the values of bulk modulus which are consistent with the experimental results.

Neumann proposed a formula of bulk modulus in terms of lattice parameter ‘a’ and spectroscopically defined bond iconicity, fi figured as:

B=boa-m(1-gofi)                                (6)

Where;

bo, m and go are constants and have the same value for all compounds. Al-Douri further proposed two formulae as:

B=(60- λ20). (EgΓXm)                   (7)

B=(30+ λ10) ((Pt1/2/ EgΓX)/3)         (8)

Where;

αm=Metallicity (in eV); EgΓX=Energy gap (in eV) along Γ–X. λ=0, 2 and 2.65 for group IV, III-V and II-VI semiconductors respectively.

Pt=Transition pressure.

Kamran, et al., however, suggested and also attempted to give theoretical basis to the following formula of bulk modulus: B=(1938.72-506.702 fi)/d3.5            (9)

Where;

fi=Bond iconicity.

Results obtained using this formula, in general, fall within 19% of the experimental values. In the bond orbital method however, the bulk modulus was proposed as:

B=2*31/2(V2 αc3 + 7.8/d2)/3d3         (10)

 

Where;

V2=Covalent energy, is given by,

V2=-ηħ2/4π2md2                             (11 )

Here;

η=Overlap parameter,
αc=Covalence of the bond and m is the mass of the electron.

This formula could give somewhat better results. In the ionic charge approach of bond orbital model, Verma proposed a d-3 dependence formula of bulk modulus.

A new formula proposed: Various formulae noted in the above sub-section clearly demonstrated the bond length dependence of bulk modulus along with some other parameters like bond ionicity, band gap, covalency, transition pressure, metallicity, covalent energy, bond charge etc. But the values predicted with different formulae differ widely among themselves and from the experimental ones. Also, the d-dependence power varies like d-3.5, d-4 and d3. This aspect, therefore, needs to be revisited. In this attempt, we begin with the basic definition of bulk modulus and proposed a semi empirical formula. From definition, bulk modulus, the property of a material showing its resistance to volume change on compression, is given by

B=-P/(dV/V)                                (12)

Where;

dV/V=Volume strain is dimensionless and the stress
P=F/A=E/V                                (13)

Here;

F=Force (restoring),
A=Area,
E=Energy
V=Volume.

The volume of the unit cell of a cubic crystal, V ∝ d3.

Where;

d=Bond length.

Therefore, bulk modulus should bear an inverse cubic dependence relation with bond length, i.e.

B ∝ E/d3                                 (14)

Here, bond energy Eb is proposed to be used in place of E. This is because the bond energy of a stronger bond must be higher and for such a bond the resistance against any deformation (volume) should be higher giving rise to higher bulk modulus. Accordingly, B is expected to bear a linear relationship with Eb/d3. With this assumption, we have applied the Universal Parameter Tight Binding (UPTB) theory to evaluate Eb and d for group–IV, IV-IV, III-V and II-VI semiconductors and some ternary and quaternary alloys. Then graphs were plotted for B versus Eb/d3 for group-IV and IV-IV, III-V and II-VI systems which were found to be linear, with the help of which the new relation has been proposed. But before arriving at the new relation, a brief introduction of UPTB theory appears plausible. In the UPTB formalism, the bond energy is expressed in terms of four main contributing energy terms as:

Equation

Where;

Ep=Promotional energy.
Eσ=Sigma bond formation energy.
Eo=Overlap energy.
Em=Metallization energy.

These constituent energies are expressed in parameterized forms through the metallic, covalent, polar and hybrid energies, which are expressed in terms of atomic orbital energies. Actually, the metallic, covalent, polar and hybrid energies originate out of the non-zero matrix elements of the Hamiltonian between hybrids of the bond forming atoms.

The hybrid energy (expectation value) of a tetrahedral solid having sp3 hybrids is given by

Equation

H=Hamiltonian of the system.

These energy values differ somewhat in the solids from the corresponding values for free atoms. However, following Harrison’s prescription the free atom energy (Hartree-Fock term) values have been utilized in the present work. The metallic energy is given by

Equation

For tetrahedral solids, considering matrix elements between nearest neighbor atoms only, Froyen and Harrison proposed that;

Equation

Where;

where the subscript m is a quantum number, but m in the denominator represents the electron mass, d is the bond length (in Å ) ηll'm and is a dimensionless coefficient with

Equation

Equation

In case of polar covalent solids, the hybrid polar energy is represented as:

Equation

Where;

c(a)=Cation (anion).

Therefore, following kraut and Harrison, a general expression of bond energy as given below was utilized.

Equation

Where;

V1IV(c) and V1IV(a) are the values of V1 for the column-IV elements from the rows of the atoms corresponding to the cation and the anion respectively. In the equilibrium state, the bond energy is minimum. But among the various energy terms, only V2 includes ‘d’. So Eb was minimized with respect to V2. Then employing Newton-Raphson numerical technique, the self-consistent values of V2, d and Eb were obtained. For selection of the overlap parameter ηo, initially, Harrison’s approach of using geometrical mean of ηo values corresponding to the respective homoploid semiconductor, i.e. for a compound AiBj with i and j denoting rows of elements A and B in the periodic table, tehffee ctive ηo is given by:

Equation

Where;

ηoi and ηoj=Values for ηo for the group-IV elements of the ith and jth rows respectively.

This mode of selection of ηo has earlier been used by Baranowski Talwar, et al. and Sasireka, et al., also, but in several cases the values of bond length deviated more from experimental values. In an attempt to improve the results, it is argued that elements exhibit periodic properties. So, each element of a period must have its own weightage in deciding the properties of a compound formed with the constituent elements. Therefore a weighted average of overlay parameters corresponding to the respective periods as given below was utilized in this study.

Equation

Where;

Pa(Pc)=Period number considering c-row as P=1.
ηoc)=Overlap parameter of anion(cation).

This modi ication led to a two prong advantage irst the results of bond length improved and second, the number of iterations reduced to get self-consistency.

Results and Discussion

Using the method discussed, bond length and bond energy of group IV and IV-IV, III-V and II-VI semiconductors were calculated and are given in Tables 1-3 respectively.

System d (in Å) Eb (in eV)
This Study Exp. Reported
Baranowski JM Baranowski JM Talwar DN, et al.
IV C 1.532 1.544 1.61 1.596 -30.877
and IV-IV Si 2.326 2.352 2.35 2.346 -13.306
  Ge 2.428 2.449 2.45 2.455 -12.273
  Sn 2703 2.81 2.8 2.734 -9.3222
  SiC 1.826 1.877 1.95 1.942 -21.506
  GeC 1.973       -19.215
  SnC 2.143       -16.639
  SiSn 2.58       -11.238
  GeSn 2.64       -10.571
  SiGe 2.398       -12.808

Table 1: Bond length, d (in Å) and bond energy, Eb (in eV) of semiconductors belonging to group IV and IV-IV semiconductors.

Systems D (in Å) Eb (in eV)
This study Exp. Reported
Baranowski JM Baranowski JM Talwar DN, et al.
III-V BN 1.538 1.565 1.57 1.561 -31.631
BP 2.039 1.965 1.96 2.356 -19.88
BAS 2.161 2.068 2.02 2.008 -17.888
AlN 1.993 1.904 1.88 1.9 -23.763
AlP 2.346 2.367 2.34 2.356 -15.207
AlAs 2.42 2.442 2.42 2.435 -14.359
AlSb 2.673 2.805 2.61 2.581 -10.632
GaN 2.026 1.953 1.9 1.93 -22.712
GaP 2.386 2.358 2.37 2.395 -15.445
GaAs 2.451 2.448 2.11 2.474 -14.405
GaSb 2.649 2.639 2.63 2.62 -12.203
InN 2.225 2.163 2.04 2.043 -19.649
InP 2.568 2.541 2.54 2.537 -13.814
InAs 2.613 2.623 2.62 2.622 -13.028
InSb 2.812 2.805 2.82 2.768 -11.14

Table 2: Bond length, d (in Å) and bond energy, Eb (in eV) of Gr. III-V semiconductors.

Systems d (in Å) Eb (in eV)
This study Exp. Reported
Baranowski JM Baranowski JM Talwar DN, et al.
II-VI BeO 1.521 1.65 1.46 1.256 -35.741
BeS 2.18 2.1   1.898 -23.415
BeSe 2.213 2.2   1.99 -21.528
BeTe 2.342 2.4   2.15 -18.296
ZnO 1.933 1.992 1.75 1.793 -28.812
ZnS 2.332 2.341 2.3 2.388 -21.247
ZnSe 2.428 2.445 2.3 2.509 -19.643
ZnTe 2.693 2.642 2.65 2.697 -16.954
CdO 2.101 2.03     -28.774
CdS 2.482 2.526 2.48 2.544 -19.623
CdSe 2.556 2.62 2.6 2.676 -18.318
CdTe 2.794 2.805 2.86 2.87 -16.005
HgS 2.342 2.513   2.556 -20.051
HgSe 2.783 2.635 2.59 2.69 -18.449
HgTe 2.902 2.797 2.85 2.886 -16.331

Table 3: Bond length, d (in Å) and bond energy, Eb (in eV) of group II-VI semiconductors.

Graphs are plotted for bulk modulus (experimental) against Eb/d3 for these systems for which linear graphs are obtained shown in Figures 1-3 respectively. Regression analysis gives high correlation of 0.996, 0.991 and 0.979 respectively for these systems.

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Figure 1: Plot of B versus Eb/d3 for gr. IV and IV-IV semiconductors.

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Figure 2: Plot of B versus Eb/d3 for III-V semiconductors.

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Figure 3: Plot of B versus Eb/d3 for II-VI semiconductors.

With the help of these graphs, the following general relation is proposed four estimation of bulk modulus of the semiconductors

B=(48.23–7.39 λ0.63547) Eb/d3 + (41.97 – 5.80 λ2.19784)                   (26)

Where;

λ=|GB-GA|/2 with GA and GB being the group numbers of elements A and B respectively in the periodic table. The calculated values of bulk modulus along with the experimental and reported ones for group–IV and IV-IV, III-V and II-VI systems are shown in Tables 4-6 respectively.

Systems Bulk modulus, B (in GPa)
This study Exp. Reported values
Using exp. d Using cal. d Lam PK, et al. Kitamura M, et al. Kamran S, et al. Cohen ML Misra G Dutta MS
C 446.56 456.14 442 393 418.2 435 444.3 449.33
Si 91.29 92.97 98 87 97.4 99 100.1 92.06
Ge 82.27 83.32 77.2 76.3 84.2 85 87.4 84.26
Sn 62.23 64.74 53 46 52.1 57 55.8 67.62
SiC 198.82 212.23 211 185 202.9 213 212.7 187.87
GeC   162.63     181a, 188b     157.49
SnC   123.51     119a, 133b     120.72
SiSn   73.98     72.47c, 68.55c     77.23
GeSn   69.68     56c, 53.8c     73.67
SiGe   86.77     88.6d, 87.6c     88.13

Table 4: Bulk modulus B (in GPa) of gr. IV and IV-IV semiconductors.

Systems Bulk modulus (B In GPa)
This work Exp. Reported values
  Using exp. d Using cal. d Lam PK, et al. Kitamura M, et al. Kamran S, et al. Misra G, et al. Misra G, et al.
BN 373.9 391.25 367 346 373 367 351.2
BP 143.18 131.95 165 165 180.4 166 154.1
BAs 118.77 108.56   138 151.8 138  
AlN 176.77 158.76     180.9    
AlP 83 84.27 86 80.5 88.3 86.7 86.3
AlAs 76.44 77.55 77 74 80.5 78.3 78.3
AlSb 55.84 58.9 58.2 54.1 56.1 57 59
GaN 160.69 147.71          
GaP 84.28 82.61 88.7 81.5 86.6 86.7 86.3
GaAs 76.27 76.12 74.8 72.4 77.4 76.1 76.1
GaSb 63.29 69.98 57 55.4 59.6 57.8 59.6
InN 115.47 169.02     111.1    
InP 70.56 69.48 71 60.8 66.1 67 68.7
InAs 65.65 65.99 60 56.3 61.2 61 62.8
InSb 56.78 56.63 47.4 44 47.7 47.1 49.4

Table 5: Bulk Modulus, B (in GPa) of III-V semiconductors.

Systems Bulk Modulus, B (in GPa)
This study Exp. Reported values
Using exp. d Using cal. d Lam PK, et al. Kitamura M, et al. Kamran S, et al. Misra G, et al. Cohen ML, et al. Kumar V, et al.
BeO 307.76 388.65           303.17
Bes 108.28 98.42   120 132.7     113.11
BeSe 89.66 88.36   105 113.2     96.55
BeTe 64 67.7   78 86.5     68.81
ZnO 149.32 161.96           146.19
ZnS 76.22 76.93 77.1 73.3 82.8 78.1 72 75.31
ZnSe 64.75 65.79 62.4 65.1 69.3 66.5 63.9 65.3
ZnTe 49.15 47.26 51 51.9 55.6 51.2 52.2 55.74
CdO 141.77 129.38            
CdS 60.1 62.52 62 53.2 62.6 60.3 59.5 56.79
CdSe 52.79 55.67 53   54.4 52.6 53.9 49.67
CdTe 42.01 42.33 42.4 40.2 42.9 41.2 44 43.32
HgS 61.79 72.72     60.1     56.52
HgSe 52.42 46.82 50   55.1 51.9 53 49.52
HgTe 42.79 39.92 42.3   46.1   45.7 41.87

Table 6: Bulk modulus, B (in GPa), of II-VI semiconductors.

In the above relation, λ takes care of the ionicity effect, because for λ=0, 1, 2 for group–IV and IV-IV, III-V and II-VI semiconductors for which the average bond iconicity increases along ((IV-IV) → (III-V) → (II-VI)). Hence the bulk modulus decreases in the sequence ((IV-IV) → (III-V) → (II-VI)). The calculated values of bulk modulus of the semiconductors studied are in reasonable agreement with the experimental and other reported values. It is interesting to note that the compounds involving elements from the carbon-row i.e. carbides, nitrides and oxides exhibit higher bulk moduli and their respective classes. This might be due to absence of core p-electrons in atoms of elements from C-row which allows them in deeper overlapping of orbitals in bond formation. Encouraged with these results, the general formula was applied as an extension to the ternary systems Cd1-xZnxS and In1-xGaxP having cation substitution, and ZnS1-xSex and InP1-xAsx having anion substitution. Results are presented in Tables 7 and 8. The graphs showing variation of bulk modulus with composition are shown in Figures 4 and 5.

System Bulk modulus, B (in GPa)
Cd1-xZnxS In1-xGaxP
x This work Exp. (Lam PK, et al.) This work Exp. (Lam PK, et al.)
0 63.487 62 71.279 71
0.01 63.606   71.394  
0.025 63.787 71.572
0.05 64.032 71.823
0.075 64.337 72.121
0.1 64.586 72.376
0.2 65.777 73.555
0.3 66.945 74.729
0.4 68.211 75.943
0.5 69.453 77.201
0.75 72.871 80.587
0.9 74.966 82.788
1 76.498 77.1 84.281 88.7

Table 7: Variation of Bulk Modulus (in GPa) with composition in ternary system Cd1-xZnxS and In1-xGaxP.

System Bulk modulus, B (in GPa)
ZnS1-xSex InP1-xAsx
x This work Exp. (Lam PK, et al.) This work Exp. (Lam PK, et al.)
0 76.498 77.1 71.279 71
0.01 76.371   71.212  
0.025 76.143 71.131
0.05 75.866 70.987
0.075 75.515 70.841
0.1 75.24 70.698
0.2 73.933 70.123
0.3 72.728 69.52
0.4 71.475 68.966
0.5 70.319 68.42
0.75 67.462 67.053
0.9 65.793 66.278
1 64.749 62.4 65.773 60

Table 8: Variation of bulk modulus (in GPa) with composition in ternary systems ZnS1-xSex and InP1-xAsx.

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Figure 4: Plot showing the variation of bulk modulus (in GPa) with composition in ternary systems Cd1-xZnxS and In1-xGaxP.

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Figure 5: Plot showing the variation of bulk modulus (in GPa) with composition in ternary systems ZnS1-xSex and InP1-xAsx.

It can be seen that B increases with x in Cd1-xZnxS and In1-xGaxP whereas it decreases with x in ZnS1-xSex and InP1-xAsx. This is primarily because of ionic size effect. With decreasing ionic size in the former case (Cd+2=0.78 Å; Zn+2=0.6 Å; In+3=0.8 Å, Ga+3=0.62 Å) the bond length decreases, ionicity decreases and the bulk modulus increases, whereas in the latter case the increasing ionic size (S-2=1.84 Å; Se-2=1.98 Å; P-3=2.12 Å; As-3=2.22 Å) leads to opposite effect. The results also exhibit a small departure from the vegard's law. Therefore, bond length and bond energy of these systems were calculated using Vegard’s law. Such deviations from Vegard's law have also been reported in the lattice constants and bulk modulus in ZnSxSe1-x, lattice constants and band gaps in AxZn1-xO (A=Ca, Cd, Mg), BxGa1-xN and band gap in BxIn1-xN alloys.

The study is further extended to dilute oxide and diluted nitride quaternary HMAs Zn1-xCdxTe1-yOy, Cd1-xZnxTe1-yOy and Ga1-xInxAs1-yNy, In1-xGaxAs1-yNy. Results are given in Tables 9 and 10.

System → Zn1-xCdxTe1-yOy Cd1-xZnxTe1-yOy
x y D (in Å) Eb (in eV) B (in GPa) d (in Å) Eb (in eV) B (in GPa)
0.1 0 2.658 16.92 48.473 2.789 16.107 42.645
  0.02 2.645 17.181 49.482 2.773 16.393 43.613
  0.04 2.632 17.441 50.514 2.758 16.679 44.578
  0.1 2.592 18.221 53.813 2.712 17.538 47.672
  0.4 2.393 22.125 74.695 2.484 21.832 67.708
  0.8 2.128 27.33 119.588 2.179 27.557 113.246
  1 1.996 29.932 153.689 2.026 30.419 149.786
0.2 0 2.675 16.819 47.651 2.772 16.208 43.325
  0.02 2.661 17.082 48.677 2.757 16.491 44.28
  0.04 2.648 17.346 49.692 2.742 16.774 45.262
  0.1 2.607 18.136 52.976 2.697 17.623 48.374
  0.4 2.405 22.088 73.714 2.472 21.868 68.561
  0.8 2.135 27.358 118.672 2.172 27.528 114.091
  1 2 29.993 153.141 2.022 30.358 150.315
0.3 0 2.691 16.717 46.887 2.756 16.31 43.994
  0.02 2.677 16.984 47.895 2.741 16.59 44.966
  0.04 2.663 17.25 48.929 2.727 16.87 45.932
  0.1 2.622 18.051 52.161 2.682 17.709 49.095
  0.4 2.416 22.052 72.827 2.461 21.905 69.369
  0.8 2.141 27.386 117.91 2.166 27.5 114.812
  1 2.003 30.054 152.801 2.019 30.297 150.645
0.5 0 2.724 16.514 45.385 2.724 16.514 45.385
  0.02 2.709 16.787 46.392 2.709 16.787 46.392
  0.04 2.695 17.06 47.39 2.695 17.06 47.39
  0.1 2.652 17.88 50.589 2.652 17.88 50.589
  0.4 2.439 21.978 71.029 2.439 21.978 71.029
  0.8 2.154 27.443 116.274 2.154 27.443 116.274
  1 2.011 30.176 151.719 2.011 30.176 151.719

Table 9: Variation of bond length, d (in Å), bond energy, Eb (in eV) and bulk modulus, B (in GPa) with composition in dilute oxide quaternary HMAs Zn1-xCdxTe1-yOy and Cd1-xZnxTe1-yOy.

System → Ga1-xInxAs1-yNy In1-xGaxAs1-yNy
x y d(in Å) Eb (in eV) B (in GPa) d(in Å) Eb (in eV) B (in GPa)
0.1 0 2.466 14.273 75.041 2.606 13.213 66.66
  0.02 2.456 14.458 76.027 2.596 13.374 67.39
  0.04 2.446 14.643 77.035 2.587 13.534 68.094
  0.1 2.416 15.198 80.183 2.559 14.014 70.324
  0.4 2.269 17.972 99.002 2.42 16.417 83.478
  0.8 2.072 21.672 135.668 2.235 19.621 107.945
  1 1.974 23.522 161.057 2.142 21.222 124.359
0.2 0 2.483 14.14 73.893 2.588 13.346 67.614
  0.02 2.473 14.322 74.844 2.579 13.509 68.333
  0.04 2.463 14.504 75.814 2.569 13.672 69.103
  0.1 2.434 15.05 78.795 2.541 14.162 71.423
  0.4 2.288 17.778 96.788 2.401 16.611 85.182
  0.8 2.093 21.415 131.559 2.214 19.877 110.97
  1 1.995 23.234 155.674 2.121 21.51 128.237
0.3 0 2.501 14.008 72.740 2.571 13.478 68.56
  0.02 2.491 14.187 73.655 2.561 13.645 69.346
  0.04 2.481 14.365 74.586 2.552 13.811 70.107
  0.1 2.452 14.902 77.453 2.523 14.31 72.559
  0.4 2.307 17.583 94.654 2.382 16.806 86.954
  0.8 2.113 21.159 127.767 2.194 20.133 114.025
  1 2.016 22.947 150.547 2.1 21.797 132.292
0.5 0 2.536 13.743 70.583 2.536 13.743 70.583
  0.02 2.526 13.916 71.431 2.526 13.916 71.431
  0.04 2.516 14.088 72.295 2.516 14.088 72.295
  0.1 2.488 14.606 74.902 2.488 14.606 74.902
  0.4 2.345 17.195 90.628 2.345 17.195 90.628
  0.8 2.154 20.646 120.539 2.154 20.646 120.539
  1 2.058 22.372 140.992 2.058 22.372 140.992

Table 10: Variation of bond length, d(in Å), bond energy, Eb (in eV) and bulk modulus, B (in GPa) with composition in dilute nitride quaternary HMAs Ga1-xInxAs1-yNy and In1-xGaxAs1-yNy.

As expected the ionic-size (ionicity) effect is clearly re lected in these systems too. The results can be seen with y ranging from 0 to 1 for a given value of x and similarly with x ranging from 0 to 0.5 for a given value of y.

Conclusion

In consideration of the importance of bulk modulus of semiconductors for various applications including solar cells, a semi empirical formula for bulk modulus of semiconductors has been proposed involving bond energy and bond length. It has been applied to group IV and IV-IV, III-V and II-VI semiconductors and also to ternary and quaternary alloys. Trend of variation of bulk modulus with composition (alloy) is interesting to note. It is hoped that this study may shed light in better understanding of the trend of variation of various properties of semiconductor alloys especially in highly mismatched alloys.

References

Citation: Pathak MK, Dutta MS, Gorai SK, Gupta AK, Sinha RN, et al. (2023) A Semi-Empirical Approach to Bulk Modulus of ANB8-N Semiconductors and Their Alloys. Arch Chem Res. 7:11.

Copyright: © 2023 Mahto P, et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.